Comparative Investigation of Pressure Effect on Structural Stability, Electronic and Optical Response of LaXO<sub>3</sub> (X = Al, In, Ga) for Optoelectronic Applications

Abstract

A first principle study intense on the density functional theory with Heydscuseria-Ernzerhof screened hybrid functional hybrid function (HSEO6) is used to assess the structural, Electronic, elastic, mechanical and optical responses of LaXOlt;subgt;3lt;/subgt; (X = Al, In, Ga) perovskite materials. The compressive investigation under the external static isotropic pressure (P= 0 to 80GaP), phase stability, band structure and their important impact on the optical response of LaAlOlt;subgt;3lt;/subgt;, LaInOlt;subgt;3lt;/subgt; and LaGaOlt;subgt;3lt;/subgt;. Electronic band structure shows that LaXOlt;subgt;3lt;/subgt; (X = Al, In Ga) semiconductor with indirect band gap and an optically inactive response up to 20GPa, while the band gap becomes direct at 80GaP. There are gamma points (G-X-Q) at 80GPa and the band gap changes from indirect to direct nature. Under main desperation physical parameters of perovskite materials are well explained the response of TDOS, PDOS and EPDOS contour plots have been well understood for the full description of the band gap. It is further observed that the external pressure enhanced upto 40GPa both materials are significantly more mechanically stable compared to pristine LaXOlt;subgt;3lt;/subgt; (X = Al, In, Ga) at 0GPa. The optical properties of LaAlOlt;subgt;3lt;/subgt;, LaGaOlt;subgt;3 lt;/subgt;and LaInOlt;subgt;3lt;/subgt;, dielectric coefficient lt;igt;(εlt;subgt;1lt;/subgt;, iεlt;subgt;2lt;/subgt;)lt;/igt; have been employed along with the optical responses like absorption, energy loss function, reflectivity and reflective index are obtained in the energy scale from 0 to 60 eV. It was observed that static dielectric constant decreases with the decrease in optical band gap. The optical tunings under the effect of pressure which are good candidates in practical optoelectronic applications are extensively used and interpreted by the calculation of the dielectric function.